Surface Profilometer Alpha-Step-500

Principal Investigator: Dr. Maggie Puga-Lambers
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The profilometer at MICROFABRITECH is a stylus-based, high-precision surface profilometer that provides two-dimensional analysis of surface topography on various surfaces (e.g. SIMS craters, semiconductor wafers, MEMS, thin films, ceramics) with a resolution of 1Å and a repeatability of 10Å (1s) or 0.1%.

For more information, contact Dr. Maggie Puga-Lambers: (352) 392-7973

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